Ion Implantation in Diazoquinone–Novolac Photoresist

نویسندگان

چکیده

The processes of modifying the structural and optical properties FP9120 S1813 diazoquinone–novolac photoresist films on single-crystal silicon wafers beyond range ions by implantation light B+, P+ heavy Sb+ have been studied using techniques attenuated total reflection Fourier-transform IR spectroscopy, indentation, measurement spectra. It has shown that during B+ ions, involving photosensitive component, naphthoquinone diazide, are dominant, which lead to formation ketene its subsequent reactions. In case radiation-induced reactions behind layer proceed predominantly with participation macromolecules main component phenol–formaldehyde resin. established differences due prevalence electronic stopping mechanism for nuclear ions.

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ژورنال

عنوان ژورنال: High Energy Chemistry

سال: 2022

ISSN: ['0018-1439', '1608-3148']

DOI: https://doi.org/10.1134/s0018143922040051